The leading supplier of NIST traceable calibration standards.
RAISE YOUR GLASS. The Silica Contamination Standard (SCS) is used to calibrate high-intensity UV tools which size and detect silica particles on the surface of bare silicon wafers.
Step Height Standards (SHS) are designed for the calibration of mechanical or optical surface profiler standards. These optical or mechanical profiler calibration standards consist of a 25 mm x 25 mm x 3 mm quartz block with a precisely etched uniform bar along with various test and diagnostic features.
Resistivity Standards (RS) span 4 decades and are designed for resistance calibration of both contact and non-contact resistivity measuring instruments. The resistance calibration standard is created by sawing a doped single crystalline ingot into wafers, lapping and chemically cleaning them to VLSI Standards' specifications.